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Facts & Figures

Specifications

Material properties identical to Silicon Pore Optics:

Very lightweight

Very strong

Capable of integration of very large lenses (meter scale) and/or very large separation.

Current angular resolution: 1/1.000.000 arcsec

Availability

XRI has TRL 3

Delivery time

Lead time prior to production 10 months

 

The XRI is an X-Ray interferometer under development, capable of detecting angular differences as small as 1 millionth of  a arcsecond.

This technology is based on the Silicon Pore Optics and is created in cooperation with the Leicester university as an additional configuration for (space based) X-ray telescopes.

Applications

Distinction of two close celestial X-Ray sources
Exact localization of X-ray sources from a large distance

Main technologies used

Want to know more? Let us know!
Max Collon
+31 71 528 4962
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